Electronics

Ultra-Low Noise Probe System For Developing Advanced ICs

The probe system is suitable for meeting complex test and measurement specifications and achieve a high-efficiency for countering environmental noise experienced in conventional probe systems FormFactor, a semiconductor test and measurement supplier, has introduced the CM300xi-ULN, a 300mm wafer probe system designed for highly accurate testing of flicker noise (1/f), random telegraph noise (RTN) and […]

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